Pulsed Anodic Oxidation of GaAs for Impurity-free Interdiffusion of GaAs/AlGaAs Quantum Wells
| dc.contributor.author | Deenapanray, Prakash | |
| dc.contributor.author | Fu, Lan | |
| dc.contributor.author | Petravic, Mladen | |
| dc.contributor.author | Jagadish, Chennupati | |
| dc.contributor.author | Gong, Bin | |
| dc.contributor.author | Lamb, Robert Norman | |
| dc.date.accessioned | 2015-12-13T23:19:45Z | |
| dc.date.available | 2015-12-13T23:19:45Z | |
| dc.date.issued | 2000 | |
| dc.date.updated | 2015-12-12T09:00:47Z | |
| dc.description.abstract | The use of pulsed anodic oxidation of GaAs for impurity-free quantum well interdiffusion is demonstrated. The GaAs capping layer of a single GaAs/Al0.3Ga0.7 As quantum well structure was oxidized and rapid thermal annealing (RTA) at 900 °C for 60 s was c | |
| dc.identifier.issn | 0142-2421 | |
| dc.identifier.uri | http://hdl.handle.net/1885/90414 | |
| dc.publisher | John Wiley & Sons Inc | |
| dc.source | Surface and Interface Analysis | |
| dc.subject | Keywords: Anodic oxidation; Crystal defects; Deep level transient spectroscopy; Epitaxial growth; Interdiffusion (solids); Rapid thermal annealing; Semiconducting aluminum compounds; Semiconducting films; Semiconducting gallium arsenide; X ray photoelectron spectro | |
| dc.title | Pulsed Anodic Oxidation of GaAs for Impurity-free Interdiffusion of GaAs/AlGaAs Quantum Wells | |
| dc.type | Journal article | |
| local.bibliographicCitation.lastpage | 760 | |
| local.bibliographicCitation.startpage | 754 | |
| local.contributor.affiliation | Deenapanray, Prakash, College of Physical and Mathematical Sciences, ANU | |
| local.contributor.affiliation | Fu, Lan, College of Physical and Mathematical Sciences, ANU | |
| local.contributor.affiliation | Petravic, Mladen, College of Physical and Mathematical Sciences, ANU | |
| local.contributor.affiliation | Jagadish, Chennupati, College of Physical and Mathematical Sciences, ANU | |
| local.contributor.affiliation | Gong, Bin, University of New South Wales | |
| local.contributor.affiliation | Lamb, Robert Norman, University of New South Wales | |
| local.contributor.authoruid | Deenapanray, Prakash, u4018937 | |
| local.contributor.authoruid | Fu, Lan, u9715386 | |
| local.contributor.authoruid | Petravic, Mladen, u8905251 | |
| local.contributor.authoruid | Jagadish, Chennupati, u9212349 | |
| local.description.notes | Imported from ARIES | |
| local.description.refereed | Yes | |
| local.identifier.absfor | 091299 - Materials Engineering not elsewhere classified | |
| local.identifier.absfor | 020501 - Classical and Physical Optics | |
| local.identifier.ariespublication | MigratedxPub20762 | |
| local.identifier.citationvolume | 29 | |
| local.identifier.doi | 10.1002/1096-9918(200011)29:11<754::AID-SIA924>3.0.CO;2-D | |
| local.identifier.scopusID | 2-s2.0-0034321361 | |
| local.type.status | Published Version |