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Photoluminescence imaging of silicon bricks

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Date

2014

Authors

Mitchell, Bernhard
Weber, Jurgen
Juhl, Mattias
MacDonald, Daniel
Trupke, Thorsten

Journal Title

Journal ISSN

Volume Title

Publisher

Conference Organising Committee

Abstract

Photoluminescence imaging techniques have recently been extended to silicon bricks for early production quality control and electronic characterisation in photovoltaics and microelectronics. This contribution reviews the state of the art of this new metho

Description

Keywords

Citation

URI

http://hdl.handle.net/1885/82716

Collections

ANU Research Publications

Source

Diffusion and Defect Data Pt.B: Solid State Phenomena

Type

Conference paper

Book Title

Entity type

Access Statement

License Rights

DOI

10.4028/www.scientific.net/SSP.205-206.118

Restricted until

2037-12-31

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01_Mitchell_Photoluminescence_imaging_of_2014.pdf (1.02 MB)

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