Using Managed Runtime Systems to Tolerate Holes in Wearable Memories
Date
2013
Authors
Gao, Tiejun
Strauss, Karin
Blackburn, Stephen
McKinley, Kathryn
Burger, Doug
Larus, James
Journal Title
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Volume Title
Publisher
Association for Computing Machinery (ACM)
Abstract
New memory technologies, such as phase-change memory (PCM), promise denser and cheaper main memory, and are expected to displace DRAM. However, many of them experience permanent failures far more quickly than DRAM. DRAM mechanisms that handle permanent fa
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Keywords
Keywords: Failure tolerance; Garbage collectors; Hardware and software; Hardware supports; Improve performance; Memory management; Phase change memory (pcm); Software and hardwares; Error correction; Failure (mechanical); Failure analysis; Hardware; Phase change me Failure tolerance; Memory management; Phase-change memory
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Source
Proceedings of the ACM SIGPLAN Conference on Programming Language Design and Implementation (PLDI)
Type
Conference paper
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Restricted until
2037-12-31
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