Electronic Conduction Properties of Au/C 60 /p-Si and C 60 /Au/p-Si Sandwich Structures: I-V and Transducer Characteristics
| dc.contributor.author | Berdinsky, A.S. | |
| dc.contributor.author | Fink, Dietmar | |
| dc.contributor.author | Yoo, J B | |
| dc.contributor.author | Chadderton, Lewis | |
| dc.contributor.author | Chun, H.G. | |
| dc.contributor.author | Han, J H | |
| dc.contributor.author | Dragunov, V.P. | |
| dc.date.accessioned | 2015-12-13T22:40:22Z | |
| dc.date.issued | 2004 | |
| dc.date.updated | 2015-12-11T09:55:33Z | |
| dc.description.abstract | Gold-fullerite [C 60]-silicon (p-type) sandwich structures have been fabricated in order to investigate intrinsic cross-sectional and planar electronic conductive properties, in particular the C 60/p-Si p-n heterojunction. The turn-on voltage of this p-n | |
| dc.identifier.issn | 0038-1098 | |
| dc.identifier.uri | http://hdl.handle.net/1885/78212 | |
| dc.publisher | Pergamon-Elsevier Ltd | |
| dc.source | Solid State Communications | |
| dc.subject | Keywords: Fullerite crystal films; Silicon pressure transducers; Crystallization; Crystals; Equivalent circuits; Fullerenes; Heavy ions; Heterojunctions; Radiation effects; Sandwich structures; Scanning electron microscopy; Silicon; Strain; Thin films; Transducers; A. Fullerenes; A. Heterojunctions; A. Thin films; C. Scanning and transmission electron microscopy; D. Radiation effects and pressure | |
| dc.title | Electronic Conduction Properties of Au/C 60 /p-Si and C 60 /Au/p-Si Sandwich Structures: I-V and Transducer Characteristics | |
| dc.type | Journal article | |
| local.bibliographicCitation.issue | 12 | |
| local.bibliographicCitation.lastpage | 814 | |
| local.bibliographicCitation.startpage | 809 | |
| local.contributor.affiliation | Berdinsky, A.S., Novosibirsk State Technical University | |
| local.contributor.affiliation | Fink, Dietmar, Hahn-Meitner-Institut | |
| local.contributor.affiliation | Yoo, J B, Sungkyunkwan University | |
| local.contributor.affiliation | Chadderton, Lewis, College of Physical and Mathematical Sciences, ANU | |
| local.contributor.affiliation | Chun, H.G., University of Ulsan | |
| local.contributor.affiliation | Han, J H, Samsung Advanced Institute of Technology | |
| local.contributor.affiliation | Dragunov, V.P., Novosibirsk State Technical University | |
| local.contributor.authoruid | Chadderton, Lewis, u1809603 | |
| local.description.embargo | 2037-12-31 | |
| local.description.notes | Imported from ARIES | |
| local.description.refereed | Yes | |
| local.identifier.absfor | 020201 - Atomic and Molecular Physics | |
| local.identifier.ariespublication | MigratedxPub6890 | |
| local.identifier.citationvolume | 130 | |
| local.identifier.doi | 10.1016/j.ssc.2004.03.051 | |
| local.identifier.scopusID | 2-s2.0-2442570644 | |
| local.type.status | Published Version |