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Study of intermixing in a GaAs/AlGaAs quantum-well structure using doped spin-on silica layers

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Authors

Fu, Lan
v. d. Heijden, R. W.
Jagadish, C.
Dao, Lap Van
Gal, M.
Tan, Hark Hoe

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American Institute of Physics (AIP)

Abstract

The effect of two different dopants, P and Ga, in spin-on glass (SOG) films on impurity-free vacancy disordering (IFVD) in GaAs/AlGaAs quantum-well structures has been investigated. It is observed that by varying the annealing and baking temperatures, P-doped SOG films created a similar amount of intermixing as the undoped SOG films. This is different from the results of other studies of P-doped SiO₂ and is ascribed to the low doping concentration of P, indicating that the doping concentration of P in the SiO₂ layer is one of the key parameters that may control intermixing. On the other hand, for all the samples encapsulated with Ga-doped SOG layers, significant suppression of the intermixing was observed, making them very promising candidates with which to achieve the selective-area defect engineering that is required for any successful application of IFVD.

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Applied Physics Letters

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