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Characterization of Semiconductor Nanowires Using Optical Tweezers

Date

Authors

Reece, Peter

Toe, Wen Jun

Wang, Fan

Paiman, Suriati

Gao, Qiang

Jagadish, Chennupati

Tan, Hark Hoe

Publisher

American Chemical Society

Abstract

We report on the optical trapping characteristics of InP nanowires with dimensions of 30 (±6) nm in diameter and 2 - 15 μm in length. We describe a method for calibrating the absolute position of individual nanowires relative to the trapping center usin

Keywords

Keywords: Absolute position; Brownian Dynamics; High-speed; InP; Investigate effects; Laser power; Length dependence; Opticaltrapping; Position sensing; Semiconductor nanowire; Trapping centers; Brownian movement; Nanowires; Optical tweezers; nanowire; article; che Brownian motion; nanoparticle metrology; optical tweezers; Semiconductor nanowires

URI

http://hdl.handle.net/1885/69048

Collections

ANU Research Publications

Source

Nano Letters

Type

Journal article

DOI

10.1021/nl200720m

Restricted until

2037-12-31

Downloads

File

Description

01_Reece_Characterization_of_2011.pdf (2.32 MB)