Keck Planet Imager and Characterizer: Concept and phased implementation
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Mawet, D
Wizinowich, Peter
Dekany, Richard G
Chun, Mark
Hall, Donald
Cetre, S
Guyon, Olivier
Wallace, L
Bowler, B
Liu, Michael C
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SPIE - The International Society for Optical Engineering
Abstract
The Keck Planet Imager and Characterizer (KPIC) is a cost-effective upgrade path to the W.M. Keck observatory (WMKO) adaptive optics (AO) system, building on the lessons learned from first and second-generation extreme AO (ExAO) coronagraphs. KPIC will explore new scientific niches in exoplanet science, while maturing critical technologies and systems for future ground-based (TMT, EELT, GMT) and space-based planet imagers (HabEx, LUVOIR). The advent of fast low-noise IR cameras (IR-APD, MKIDS, electron injectors), the rapid maturing of efficient wavefront sensing (WFS) techniques (Pyramid, Zernike), small inner working angle (IWA) coronagraphs (e.g., vortex) and associated low-order wavefront sensors (LOWFS), as well as recent breakthroughs in high contrast high resolution spectroscopy, open new direct exoplanet exploration avenues that are complementary to planet imagers such as VLT-SPHERE and the Gemini Planet Imager (GPI). For instance, the search and detailed characterization of planetary systems on solar-system scales around late-type stars, mostly beyond SPHERE and GPI’s reaches, can be initiated now at WMKO.
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Proceedings of SPIE Volume 9909: The International Society for Optical Engineering
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