Quantum well intermixing by ion implantation

dc.contributor.authorBarnett, Anneen_AU
dc.date.accessioned2003-01-13en_US
dc.date.accessioned2004-05-19T15:29:23Zen_US
dc.date.accessioned2011-01-05T08:47:35Z
dc.date.available2004-05-19T15:29:23Zen_US
dc.date.available2011-01-05T08:47:35Z
dc.date.issued2002
dc.description.abstractThe work carried out in this study explored the phenomenon of ion implantation induced intermixing in quantum well structures. Two quantum well systems were investigated; the unstrained GaAs/Al_xGa_(1-x)As system, and the strained In_xGa_(1-x)As/GaAs system. Previous results from proton and arsenic implantation into these systems were verified, and new work on Boron implantation was conducted to test the medium mass ion regime.en_US
dc.format.extent1781395 bytesen_US
dc.format.mimetypeapplication/pdfen_US
dc.identifier.otherb37574292
dc.identifier.urihttp://hdl.handle.net/1885/41355
dc.language.isoen_AUen_US
dc.subjectQuantum wellsen_US
dc.subjection implantationen_US
dc.subjectprotonen_US
dc.subjectarsenicen_US
dc.subjectboronen_US
dc.titleQuantum well intermixing by ion implantationen_US
dc.typeThesis (Honours)en_US
local.contributor.affiliationANUen_US
local.contributor.affiliationDepartment of Electronic Materials Engineering, RSPSEen_US
local.description.refereednoen_US
local.identifier.citationmonthnoven_US
local.identifier.citationyear2002en_US
local.identifier.doi10.25911/5d7a28b23b256
local.identifier.eprintid762en_US
local.mintdoimint
local.rights.ispublishednoen_US

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