In situ sediment dispersion estimates in the presence of discrete layers and gradients
One of the difficulties in validating sediment models has been the lack of reliable low frequency dispersion measurements. A reflection method is presented that yields in situ dispersion without sediment disturbance over a broad range of frequencies and can explicitly disentangle frequency-dependent effects of vertical structure, e.g., layers and gradients. Measurements on the outer shelf from 300 to 3000 Hz show that dispersion is a strong function of depth in the sediment column. The depth...[Show more]
|Collections||ANU Research Publications|
|Source:||Journal of the Acoustical Society of America|
|01_Holland_%3Ci%3EIn_situ%3C%2Fi%3E_sediment_2013.pdf||731.87 kB||Adobe PDF||Request a copy|
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