Holland, Charles W.; Dettmer, Jan
One of the difficulties in validating sediment models has been the lack of reliable low frequency dispersion measurements. A reflection method is presented that yields in situ dispersion without sediment disturbance over a broad range of frequencies and can explicitly disentangle frequency-dependent effects of vertical structure, e.g., layers and gradients. Measurements on the outer shelf from 300 to 3000 Hz show that dispersion is a strong function of depth in the sediment column. The depth...[Show more]
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