Pethes, I; Kaban, I; Wang, Rongping; Luther-Davies, Barry; Jovari, P
The structure of GexAs10Se90x (x = 10, 17.5, 22.5, 27.5, 30, 35) glasses as well as some other compositions extensively used in infrared optics, e.g. GASIR (Ge22As20Se58) and AMTIR-1 (Ge33As12Se55) has been investigated by X-ray diffraction (XRD) and extended X ray absorption fine structure (EXAFS) measurements at the Ge, As and Se K-edges. Structural models have been obtained by fitting simultaneously XRD and EXAFS data by the reverse Monte Carlo simulation technique. Unlike other IV–V–VI...[Show more]
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