Sun, Chang; Liu, An Yao; Rougieux, Fiacre; MacDonald, Daniel
The defect parameters of isolated Cri and chromium-boron (CrB) pairs are reassessed by conducting lifetime spectroscopy on both n- and p-type, Cr-doped silicon samples with different doping levels, and fitting the lifetimes with the Shockley-Read-Hall (SRH) model. The uncertainty ranges of the parameters are significantly tightened through a combined analysis of the two defects with the lifetime data measured on both n- and p-type samples. Both the experimental data and the modelling results...[Show more]
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