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Uncertainty analysis for the coefficient of band-to-band absorption of crystalline silicon

Schinke, Carsten; Peest, P. Christian; Schmidt, Jan; Brendel, Rolf; Bothe, Karsten; Vogt, Malte R.; Kroger, Ingo; Winter, Stefan; Schirmacher, Alfred; Lim, Siew Yee; Nguyen, Hieu; MacDonald, Daniel

Description

We analyze the uncertainty of the coefficient of band-to-band absorption of crystalline silicon. For this purpose, we determine the absorption coefficient at room temperature (295K) in the wavelength range from 250 to 1450nm using four different measurement methods. The data presented in this work derive from spectroscopic ellipsometry, measurements of reflectance and transmittance, spectrally resolved luminescence measurements and spectral responsivity measurements. A systematic measurement...[Show more]

CollectionsANU Research Publications
Date published: 2015
Type: Journal article
URI: http://hdl.handle.net/1885/98466
Source: AIP Advances
DOI: 10.1063/1.4923379

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