Schinke, Carsten; Peest, P. Christian; Schmidt, Jan; Brendel, Rolf; Bothe, Karsten; Vogt, Malte R.; Kroger, Ingo; Winter, Stefan; Schirmacher, Alfred; Lim, Siew Yee; Nguyen, Hieu; MacDonald, Daniel
We analyze the uncertainty of the coefficient of band-to-band absorption of crystalline silicon. For this purpose, we determine the absorption coefficient at room temperature (295K) in the wavelength range from 250 to 1450nm using four different measurement methods. The data presented in this work derive from spectroscopic ellipsometry, measurements of reflectance and transmittance, spectrally resolved luminescence measurements and spectral responsivity measurements. A systematic measurement...[Show more]
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