Kiran, M. S. R. N.; Kshirsagar, S.; Krishna, M. G.; Tewari, Surya P.
Structural, optical and nanomechanical properties of nanocrystalline Zinc Telluride (ZnTe) films
of thickness upto 10 microns deposited at room temperature on borosilicate glass substrates are reported.
X-ray diffraction patterns reveal that the films were preferentially oriented along the (1 1 1) direction.
The maximum refractive index of the films was 2.74 at a wavelength of 2000 nm. The optical band gap
showed strong thickness dependence. The average film hardness and Young’s modulus...[Show more]
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