Wang, R. P.; Choi, D. Y.; Rode, A. V.; Madden, S. J.; Luther-Davies, B.
We have measured and analyzed x-ray photoelectron spectra(XPS) of as-grown and annealedGe33As12Se55films compared with bulk material. We found that the as-grown film contains a large number of separated Se clusters which can coalesce with As and Ge after annealing at high temperatures. In addition, both the Ge and As 3dspectra show the presence of oxides. While the Geoxidation increases with an increasing annealing temperature, As oxidation is almost unaffected by annealing. The difference...[Show more]
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