Generalized procedure to determine the dependence of steady-state photoconductance lifetime on the occupation of multiple defects
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McIntosh, Keith R.; Paudyal, Bijaya B.; Macdonald, Daniel H.
Description
We present a procedure to determine the dependence of photoconductance lifetime on the occupation of multiple defects. The procedure requires numerical iteration, making it more cumbersome than the analytical equations available for single-defect and simplified two-defect cases, but enabling the following features: (i) it accounts for the defect concentration when calculating the equilibrium carrier concentrations, (ii) it permits recombination through any number of defects, (iii) it calculates...[Show more]
dc.contributor.author | McIntosh, Keith R. | |
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dc.contributor.author | Paudyal, Bijaya B. | |
dc.contributor.author | Macdonald, Daniel H. | |
dc.date.accessioned | 2015-12-18T00:12:56Z | |
dc.date.available | 2015-12-18T00:12:56Z | |
dc.identifier.issn | 0021-8979 | |
dc.identifier.uri | http://hdl.handle.net/1885/95092 | |
dc.description.abstract | We present a procedure to determine the dependence of photoconductance lifetime on the occupation of multiple defects. The procedure requires numerical iteration, making it more cumbersome than the analytical equations available for single-defect and simplified two-defect cases, but enabling the following features: (i) it accounts for the defect concentration when calculating the equilibrium carrier concentrations, (ii) it permits recombination through any number of defects, (iii) it calculates the occupation fraction of all defects at any injection, and (iv) it promotes a good understanding of the role of defect occupation in photoconductance measurements. The utility of the numerical procedure is demonstrated on an experimental sample containing multiple defects. The dependence of the sample’s photoconductance on carrier concentration and temperature can be qualitatively described by the generalized procedure but not by either analytical model. The example also demonstrates that the influence of defect occupation on photoconductance lifetime measurements is mitigated at elevated temperatures—a conclusion of particular worth to the study of multicrystalline silicon. | |
dc.description.sponsorship | This work was funded by an Australian Research Council Linkage Grant between the Australian National University, SierraTherm Production Furnaces, and SunPower Corporation. D.M. is supported by an Australian Research Council fellowship. | |
dc.publisher | American Institute of Physics (AIP) | |
dc.rights | http://www.sherpa.ac.uk/romeo/issn/0021-8979..."Publishers version/PDF may be used on author's personal website, institutional website or institutional repository" from SHERPA/RoMEO site (as at 18/12/15). Copyright 2008 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Journal of Applied Physics and may be found at https://doi.org/10.1063/1.2999640 | |
dc.source | Journal of Applied Physics | |
dc.subject | Keywords: Bioactivity; Carrier concentration; Civil aviation; Concentration (process); Employment; Polysilicon; Silicon; Analytical equations; Analytical models; Defect concentrations; Elevated temperatures; Experimental samples; Multicrystalline silicons; Multiple | |
dc.title | Generalized procedure to determine the dependence of steady-state photoconductance lifetime on the occupation of multiple defects | |
dc.type | Journal article | |
local.description.notes | Imported from ARIES | |
local.identifier.citationvolume | 104 | |
dc.date.issued | 2008-10-17 | |
local.identifier.absfor | 090605 | |
local.identifier.ariespublication | u9606031xPUB7 | |
local.publisher.url | https://www.aip.org/ | |
local.type.status | Published Version | |
local.contributor.affiliation | McIntosh, Keith, College of Engineering and Computer Science, College of Engineering and Computer Science, Research School of Engineering, The Australian National University | |
local.contributor.affiliation | Paudyal, Bijaya, College of Engineering and Computer Science, College of Engineering and Computer Science, Research School of Engineering, The Australian National University | |
local.contributor.affiliation | MacDonald, Daniel, College of Engineering and Computer Science, College of Engineering and Computer Science, Research School of Engineering, The Australian National University | |
local.bibliographicCitation.issue | 8 | |
local.bibliographicCitation.startpage | 084503 | |
local.identifier.doi | 10.1063/1.2999640 | |
dc.date.updated | 2016-02-24T12:11:05Z | |
local.identifier.scopusID | 2-s2.0-55249083311 | |
local.identifier.thomsonID | 000260572100110 | |
Collections | ANU Research Publications |
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