Generation of a phase-flipped Gaussian mode for optical measurements
We propose optical techniques for the generation of a TEM00 Gaussian beam which has a π phase flip in the electric field amplitudes between the two halves of the beam profile. The methods make use of a special waveplate and a masked Sagnac interferometer
|Collections||ANU Research Publications|
|Source:||Journal of Optics A: Pure and Applied Optics|
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