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Generation of a phase-flipped Gaussian mode for optical measurements

Delaubert, V; Shaddock, Daniel; Lam, Ping Koy; Buchler, Benjamin; Bachor, Hans; McClelland, David

Description

We propose optical techniques for the generation of a TEM00 Gaussian beam which has a π phase flip in the electric field amplitudes between the two halves of the beam profile. The methods make use of a special waveplate and a masked Sagnac interferometer

CollectionsANU Research Publications
Date published: 2002
Type: Journal article
URI: http://hdl.handle.net/1885/94647
Source: Journal of Optics A: Pure and Applied Optics
DOI: 10.1088/1464-4258/4/4/305

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