A millisecond X-ray reflectometer
White, John; Brown, A S; Garrett, Richard Frederick; King, David; Dowling, Trevor
Description
Many important processes occur at surfaces and interfaces on timescales ranging from milliseconds up to hours. The advent of third generation synchrotrons provides X-ray fluxes sufficiently high that it is now conceivable that these processes can be studied with millisecond time resolution using X-ray reflectometry. Several configurations for an X-ray reflectometer designed to measure X-ray reflectivity profiles with this time resolution are examined. The feasibility of each configuration in...[Show more]
Collections | ANU Research Publications |
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Date published: | 1999 |
Type: | Journal article |
URI: | http://hdl.handle.net/1885/93853 |
Source: | Australian Journal of Physics |
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