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A millisecond X-ray reflectometer

White, John; Brown, A S; Garrett, Richard Frederick; King, David; Dowling, Trevor

Description

Many important processes occur at surfaces and interfaces on timescales ranging from milliseconds up to hours. The advent of third generation synchrotrons provides X-ray fluxes sufficiently high that it is now conceivable that these processes can be studied with millisecond time resolution using X-ray reflectometry. Several configurations for an X-ray reflectometer designed to measure X-ray reflectivity profiles with this time resolution are examined. The feasibility of each configuration in...[Show more]

CollectionsANU Research Publications
Date published: 1999
Type: Journal article
URI: http://hdl.handle.net/1885/93853
Source: Australian Journal of Physics

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