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Structural Characterization of Amorphized InP: Evidence for Chemical Disorder

Glover, Christopher; Ridgway, Mark C; Yu, Kin Man; Foran, Garry J; Lee, T W; Moon, Y; Yoon, Euijoon

Description

Extended X-ray absorption fine structure measurements at the In K edge of stoichiometric InP amorphized by ion implantation reveal overcoordination of the In atom constituents and the presence of chemical disorder in the form of like-atom bonding. Excellent agreement is found between the measured bond-lengths and coordination numbers and recent theoretical calculations. The fraction of like-atom bonding is significant, suggesting that amorphous InP is best described by a Polk-like continuous...[Show more]

CollectionsANU Research Publications
Date published: 1999
Type: Journal article
URI: http://hdl.handle.net/1885/93685
Source: Applied Physics Letters

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