Skip navigation
Skip navigation

Refractive indices and thickness of optical waveguides fabricated by Si ion implantation into silica glass

Gerondakis, Steve; Kubica, J; Zamora, M; Reeves, G K; Ridgway, Mark C; Johnson, Christopher


Planar optical waveguides formed by Si ion implantation into PECVD SiO2 have been characterized by the dark mode spectroscopy method at a wavelength of 0.6328 μm. The measured effective index values of the guided modes have been used to investigate the o

CollectionsANU Research Publications
Date published: 1999
Type: Journal article
Source: Thin Solid Films
DOI: 10.1016/S0040-6090(98)01333-9


File Description SizeFormat Image
01_Gerondakis_Refractive_indices_and_1999.pdf371.02 kBAdobe PDF    Request a copy

Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.

Updated:  22 January 2019/ Responsible Officer:  University Librarian/ Page Contact:  Library Systems & Web Coordinator