Skip navigation
Skip navigation

Measurement of differential and actual recombination parameters on crystalline silicon wafers

Schmidt, Jan

Description

In this paper, for the first time, measurements of differential and actual recombination parameters on crystalline silicon wafers are directly compared. In order to determine the differential bulk lifetime and the differential surface recombination velocity (SRV), small-signal light-biased microwave-detected photoconductance decay (MW-PCD) and modulated free-carrier absorption (MFCA) measurements are performed. The results obtained by these widespread techniques are compared with...[Show more]

CollectionsANU Research Publications
Date published: 1999
Type: Journal article
URI: http://hdl.handle.net/1885/92068
Source: IEEE Transactions on Electron Devices
DOI: 10.1109/16.791991

Download

There are no files associated with this item.


Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.

Updated:  20 July 2017/ Responsible Officer:  University Librarian/ Page Contact:  Library Systems & Web Coordinator