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Molecular Effect in Semiconductors under Heavy-Ion Bombardment: Quantitative Approach Based on the Concept of Nonlinear Displacement Spikes

Titov, A I; Belyakov, V S; Kucheyev, Sergei

Description

A model is developed which is able to describe depth profiles of the efficiency of the molecular effect in damage accumulation in semiconductors under heavy atomic and molecular ion bombardment. In the model, it is assumed that completely disordered zones form due to a catastrophic collapse of the crystalline lattice into an amorphous state when the disorder level within a collision cascade exceeds some critical value fc. Rather low values of fc are obtained for this spontaneous...[Show more]

CollectionsANU Research Publications
Date published: 2002
Type: Journal article
URI: http://hdl.handle.net/1885/91877
Source: Nuclear Instruments and Methods in Physics Research: Section B
DOI: 10.1016/S0168-583X(02)00784-X

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