Skip navigation
Skip navigation

Trap-Limited Migration of Vacancy-Type Defects in 7.5 keV H - -Implanted Si

CollectionsANU Research Publications
Date published: 2002
Type: Journal article
URI: http://hdl.handle.net/1885/91668
Source: Applied Physics Letters

Download

There are no files associated with this item.


Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.

Updated:  20 July 2017/ Responsible Officer:  University Librarian/ Page Contact:  Library Systems & Web Coordinator