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Structural Characterization of Amorphised InAs with Synchrotron Radiation

de Azevedo, Gustavo; Ridgway, Mark C; Yu, Kin Man; Glover, C J; Foran, Garry J

Description

Extended X-ray absorption fine structure measurements have been utilized to determine the structural parameters of InAs amorphised by ion implantation. Relative to crystalline standards, increases in bond length and Debye-Waller factor were apparent. Our

CollectionsANU Research Publications
Date published: 2002
Type: Journal article
URI: http://hdl.handle.net/1885/91624
Source: Nuclear Instruments and Methods in Physics Research: Section B
DOI: 10.1016/S0168-583X(02)00471-8

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