Accurate Depth Profiling Through Energy-Dependent Pulse Height Deficit Compensation in Gas Ionization Detectors
The impact of the pulse height deficit effect in gas ionization detectors on the accurate extraction of depth information from heavy ion elastic recoil detection spectra has been investigated. Thin GaN films and GexSi1-x/Si heterostructures have been analyzed with a 200 MeV 197Au beam. Employing an empirical parameterisation of the pulse height deficit, a global energy calibration of the detector can be achieved. Energy spectra have been compared, calibrated with either a constant or a full...[Show more]
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|Source:||Nuclear Instruments and Methods in Physics Research: Section B|
|01_Dall (previously Weijers)_Accurate_Depth_Profiling_2002.pdf||185.24 kB||Adobe PDF||Request a copy|
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