Trapping of minority carriers in mulicrystalline silicon
MacDonald, Daniel; Cuevas, Andres
Description
Photoconductance measurements have shown anomalously high effective carrier lifetimes on cast multicrystalline silicon wafers. This anomaly is demonstrated as the result of minority carrier trapping, and is explained both quantitatively and qualitatively
Collections | ANU Research Publications |
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Date published: | 1999 |
Type: | Journal article |
URI: | http://hdl.handle.net/1885/91602 |
Source: | Applied Physics Letters |
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File | Description | Size | Format | Image |
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01_MacDonald_Trapping_of_minority_carriers_1999.pdf | 437.71 kB | Adobe PDF | Request a copy |
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