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Trapping of minority carriers in mulicrystalline silicon

MacDonald, Daniel; Cuevas, Andres

Description

Photoconductance measurements have shown anomalously high effective carrier lifetimes on cast multicrystalline silicon wafers. This anomaly is demonstrated as the result of minority carrier trapping, and is explained both quantitatively and qualitatively

CollectionsANU Research Publications
Date published: 1999
Type: Journal article
URI: http://hdl.handle.net/1885/91602
Source: Applied Physics Letters

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