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Characterization of Silicon Oxynitride Films using Ion Beam Analysis Techniques

Walker, S R; Davies, J; Mascher, P; Wallace, S G; Lennard, W N; Massoumi, G; Elliman, Robert; Ophel, T; Timmers, Heiko


Heavy-ion elastic recoil detection analysis (HIERDA) is the ideal technique for quantitative analysis of silicon oxynitride films on silicon because of its unique ability to measure simultaneously all elements of interest (i.e., H, C, N, O and Si), thereby permitting key parameters such as the O/N-ratio to be determined in a single measurement. However, high-energy accelerators suitable for such HIERDA measurements are becoming much less readily available. Hence, the present paper investigates...[Show more]

CollectionsANU Research Publications
Date published: 2000
Type: Journal article
Source: Nuclear Instruments and Methods in Physics Research: Section B
DOI: 10.1016/S0168-583X(00)00239-1


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