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Imaging Charge Trap Distributions in GaN Using Environmental Scanning Electron Micrsocopy

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Toth, M; Kucheyev, Sergei; Williams, James; Jagadish, Chennupati; Phillips, Matthew R; Li, Gang

Description

We present direct experimental evidence for a field assisted component in images acquired using the gaseous secondary electron detector (GSED) employed in environmental scanning electron microscopes. Enhanced secondary electron (SE) emission was observed

dc.contributor.authorToth, M
dc.contributor.authorKucheyev, Sergei
dc.contributor.authorWilliams, James
dc.contributor.authorJagadish, Chennupati
dc.contributor.authorPhillips, Matthew R
dc.contributor.authorLi, Gang
dc.date.accessioned2015-12-13T23:17:50Z
dc.identifier.issn0003-6951
dc.identifier.urihttp://hdl.handle.net/1885/89889
dc.description.abstractWe present direct experimental evidence for a field assisted component in images acquired using the gaseous secondary electron detector (GSED) employed in environmental scanning electron microscopes. Enhanced secondary electron (SE) emission was observed
dc.publisherAmerican Institute of Physics (AIP)
dc.sourceApplied Physics Letters
dc.titleImaging Charge Trap Distributions in GaN Using Environmental Scanning Electron Micrsocopy
dc.typeJournal article
local.description.notesImported from ARIES
local.description.refereedYes
local.identifier.citationvolume77
dc.date.issued2000
local.identifier.absfor020204 - Plasma Physics; Fusion Plasmas; Electrical Discharges
local.identifier.ariespublicationMigratedxPub20123
local.type.statusPublished Version
local.contributor.affiliationToth, M, University of Cambridge
local.contributor.affiliationKucheyev, Sergei, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationWilliams, James, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationJagadish, Chennupati, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationPhillips, Matthew R, University of Technology Sydney
local.contributor.affiliationLi, Gang, ShenZhen Fangda GuoKe Optronics Technical Co Ltd
local.description.embargo2037-12-31
local.bibliographicCitation.startpage1342
local.bibliographicCitation.lastpage1344
dc.date.updated2015-12-12T08:54:36Z
local.identifier.scopusID2-s2.0-0001757260
CollectionsANU Research Publications

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