Imaging Charge Trap Distributions in GaN Using Environmental Scanning Electron Micrsocopy
We present direct experimental evidence for a field assisted component in images acquired using the gaseous secondary electron detector (GSED) employed in environmental scanning electron microscopes. Enhanced secondary electron (SE) emission was observed
|Collections||ANU Research Publications|
|Source:||Applied Physics Letters|
|01_Toth_Imaging_Charge_Trap_2000.pdf||529.1 kB||Adobe PDF||Request a copy|
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