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High-energy X-ray diffuse scattering using Weissenberg flat-cone geometry

Butler, B; Haeffner, D; Lee, Peter T; Welberry, Thomas


A technique for the measurement of diffuse X-ray scattering on individual reciprocal-space planes using high-energy X-ray photons is described. The method is demonstrated using a disordered crystal of the compound T1SbOGeO4 and compared to data collected

CollectionsANU Research Publications
Date published: 2000
Type: Journal article
Source: Journal of Applied Crystallography
DOI: 10.1107/S0021889800005318


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