Bradby, Jodie; Williams, James; Wong-Leung, Yin-Yin (Jennifer); Swain, Michael Vincent; Munroe, Paul
Spherical indentation of crystalline silicon has been studied using cross-sectional transmission electron microscopy (XTEM). Indentation loads were chosen below and above the yield point for silicon to investigate the modes of plastic deformation. Slip planes are visible in the XTEM micrographs in both indentation loads studied. A thin layer of polycrystalline material has been identified (indexed as Si-XII from diffraction patterns) on the low-load indentation. The higher-load indentation...[Show more]
Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.