Skip navigation
Skip navigation

Transmission Electron Microscopy Observation of Deformation Microstructure under Spherical Indentation in Silicon

Bradby, Jodie; Williams, James; Wong-Leung, Yin-Yin (Jennifer); Swain, Michael Vincent; Munroe, Paul

Description

Spherical indentation of crystalline silicon has been studied using cross-sectional transmission electron microscopy (XTEM). Indentation loads were chosen below and above the yield point for silicon to investigate the modes of plastic deformation. Slip planes are visible in the XTEM micrographs in both indentation loads studied. A thin layer of polycrystalline material has been identified (indexed as Si-XII from diffraction patterns) on the low-load indentation. The higher-load indentation...[Show more]

CollectionsANU Research Publications
Date published: 2000
Type: Journal article
URI: http://hdl.handle.net/1885/89788
Source: Applied Physics Letters

Download

File Description SizeFormat Image
01_Bradby_Transmission_Electron_2000.pdf482.67 kBAdobe PDF    Request a copy


Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.

Updated:  20 July 2017/ Responsible Officer:  University Librarian/ Page Contact:  Library Systems & Web Coordinator