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Growth of silicated films at the solid/liquid interface

Holt, Stephen; Reynolds, Philip; White, John

Description

Studies of the initial stages of growth of silicated films at the silicon/liquid interface have been performed with neutron reflectometry. The use of special cells allows this first direct observation of film growth by reflectometry that is not at the air/solution interface, removing complications due to drying. The induction period is reduced in time compared with the air/water interface case and the appearance of diffraction peaks is not dependent on whether the silicon surface is initially...[Show more]

CollectionsANU Research Publications
Date published: 2000
Type: Journal article
URI: http://hdl.handle.net/1885/89034
Source: Physical Chemistry Chemical Physics
DOI: 10.1039/b007606f

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