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Structural development of silicated films self-assembled at the air-water interface

Holt, Stephen; Ruggles, Jeremy; Reynolds, Philip; White, John

Description

The development of structure perpendicular to and in the plane of the interface has been studied for mesoporous silicate films self-assembled at the air/water interface. The use of constrained X-ray and neutron specular reflectometry has enabled a detailed study of the structural development perpendicular to the interface during the pre-growth phase. Off-specular neutron reflectometry and grazing incidence X-ray diffraction has enabled the in-plane structure to be probed with excellent time...[Show more]

CollectionsANU Research Publications
Date published: 2003
Type: Journal article
URI: http://hdl.handle.net/1885/88555
Source: Physica B
DOI: 10.1016/S0921-4526(03)00289-8

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