Controlled Modification and Direct Characterization of Multimode-fiber Refractive-index Profiles
A combination of controlled annealing and characterization by scanning probe microscopy (SPM) is used to demonstrate that the refractive-index profile of a commercially available silica-based optical fiber can be accurately reconfigured for use as an evanescent field sensor. The process relies on the controlled relocation of the silica glass dopants across the fiber cross section through heat treatment and the accurate measurement of the resulting dopant redistribution with SPM and differential...[Show more]
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