Flexible phases, modulated structures and the transmission electron microscope

Abstract

A review of the application of transmission electron microscopy to the study of interface, composite and displacively modulated structures is given. The distinctly different mechanisms underlying structural modulation in each case are emphasized as is the practical application of transmission electron microscopy to problems such as pseudo-symmetry and twinning, to indexation in (3+d)-dimensional superspace and to overall superspace symmetry and structural characterization.