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Influence of Electron Diffraction on Measured Energy-resolved Momentum Densities in Single-crystalline Silicon

Vos, Maarten; Kheifets, Anatoli; Sashin, Vladimir; Weigold, Erich

Description

Electron momentum spectroscopy is used to determine the spectral function of silicon single crystals. In these experiments 50 keV electrons impinge on a self-supporting thin silicon film and scattered and ejected electrons emerging from this sample with energies near 25 keV are detected in coincidence. Diffraction effects are present that give rise to additional structures in the measured spectral momentum densities. Spectra for a specific momentum value can be obtained at different...[Show more]

dc.contributor.authorVos, Maarten
dc.contributor.authorKheifets, Anatoli
dc.contributor.authorSashin, Vladimir
dc.contributor.authorWeigold, Erich
dc.date.accessioned2015-12-13T23:08:29Z
dc.identifier.issn0022-3697
dc.identifier.urihttp://hdl.handle.net/1885/86726
dc.description.abstractElectron momentum spectroscopy is used to determine the spectral function of silicon single crystals. In these experiments 50 keV electrons impinge on a self-supporting thin silicon film and scattered and ejected electrons emerging from this sample with energies near 25 keV are detected in coincidence. Diffraction effects are present that give rise to additional structures in the measured spectral momentum densities. Spectra for a specific momentum value can be obtained at different orientations of the crystal relative to the analysers. By comparing these spectra for which the measured momentum density is the same, but the diffraction conditions of the incoming and outgoing electron trajectories differ, one can distinguish between features due to diffraction of the incoming and/or outgoing electrons, and those due to the electronic structure of the target itself.
dc.publisherPergamon-Elsevier Ltd
dc.sourceJournal of Physics and Chemistry of Solids
dc.subjectKeywords: Electron diffraction; Electronic structure; Single crystals; Electron trajectories; Semiconducting silicon C. Electron; Diffraction
dc.titleInfluence of Electron Diffraction on Measured Energy-resolved Momentum Densities in Single-crystalline Silicon
dc.typeJournal article
local.description.notesImported from ARIES
local.description.refereedYes
local.identifier.citationvolume64
dc.date.issued2003
local.identifier.absfor020201 - Atomic and Molecular Physics
local.identifier.ariespublicationMigratedxPub15681
local.type.statusPublished Version
local.contributor.affiliationVos, Maarten, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationKheifets, Anatoli, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationSashin, Vladimir, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationWeigold, Erich, College of Physical and Mathematical Sciences, ANU
local.description.embargo2037-12-31
local.bibliographicCitation.startpage2507
local.bibliographicCitation.lastpage2515
local.identifier.doi10.1016/j.jpcs.2003.08.004
dc.date.updated2015-12-12T08:13:56Z
local.identifier.scopusID2-s2.0-0142154064
CollectionsANU Research Publications

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