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Influence of Electron Diffraction on Measured Energy-resolved Momentum Densities in Single-crystalline Silicon

Vos, Maarten; Kheifets, Anatoli; Sashin, Vladimir; Weigold, Erich

Description

Electron momentum spectroscopy is used to determine the spectral function of silicon single crystals. In these experiments 50 keV electrons impinge on a self-supporting thin silicon film and scattered and ejected electrons emerging from this sample with energies near 25 keV are detected in coincidence. Diffraction effects are present that give rise to additional structures in the measured spectral momentum densities. Spectra for a specific momentum value can be obtained at different...[Show more]

CollectionsANU Research Publications
Date published: 2003
Type: Journal article
URI: http://hdl.handle.net/1885/86726
Source: Journal of Physics and Chemistry of Solids
DOI: 10.1016/j.jpcs.2003.08.004

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