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Growth of Highly Ordered Thin Silicate Films at the Air-Water Interface

Brown, A S; Holt, Stephen; Reynolds, Philip; Penfold, J; White, John

Description

The growth of thin silicate-organic films at the air-water interface of surfactant solutions has been studied in situ by X-ray and neutron reflectivity to a resolution of ca. 5 Å. Surfactant in the solution and the air-water interface itself are involved

CollectionsANU Research Publications
Date published: 1998
Type: Journal article
URI: http://hdl.handle.net/1885/85381
Source: Langmuir

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