Ridgway, Mark C; de Azevedo, Gustavo; Elliman, Robert; Wesch, W; Glover, Christopher; Miller, R; Llewellyn, David; Foran, Garry J; Hansen, Jeffrey; Nylandsted-Larsen, A
Extended X-ray absorption fine structure and Raman spectroscopies have been used to compare the crystalline-to-amorphous phase transformation in nanocrystalline and polycrystalline Ge. We demonstrate Ge nanocrystals are extremely sensitive to ion irradiation and are rendered amorphous at an ion dose ∼40 times less than that required to amorphise bulk, crystalline standards. This rapid amorphisation is attributed to the higher-energy nanocrystalline structural state prior to irradiation,...[Show more]
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