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Temperature-dependent EXAFS measurements of InP

Schnohr, Claudia; Kluth, Patrick; Araujo, Leandro; Sprouster, David; Foran, Garry J; Ridgway, Mark C

Description

The extended X-ray absorption fine structure (EXAFS) of crystalline InP was measured in the temperature range of 20-295 K. Structural parameters were determined for the first, second and third nearest neighbor (NN) shells. The Debye-Waller factors increase as functions of both radial distance and temperature. The first NN Debye-Waller factor increases slowly with temperature whereas those for the second and third NN shell increase significantly. The influence of correlated motion on the...[Show more]

dc.contributor.authorSchnohr, Claudia
dc.contributor.authorKluth, Patrick
dc.contributor.authorAraujo, Leandro
dc.contributor.authorSprouster, David
dc.contributor.authorForan, Garry J
dc.contributor.authorRidgway, Mark C
dc.coverage.spatialCampinas (Brazil)
dc.date.accessioned2015-12-13T23:02:17Z
dc.date.available2015-12-13T23:02:17Z
dc.date.created20-23 July 2008
dc.identifier.isbn9780735406254
dc.identifier.urihttp://hdl.handle.net/1885/84821
dc.description.abstractThe extended X-ray absorption fine structure (EXAFS) of crystalline InP was measured in the temperature range of 20-295 K. Structural parameters were determined for the first, second and third nearest neighbor (NN) shells. The Debye-Waller factors increase as functions of both radial distance and temperature. The first NN Debye-Waller factor increases slowly with temperature whereas those for the second and third NN shell increase significantly. The influence of correlated motion on the vibrational behavior of the different shells is readily evidenced. Fitting an Einstein model to the first NN Debye-Waller factor yields an Einstein temperature ΘE = 394 ± 8 K, compared to a value of ΘE = 360 ± 24 K for GaAs. Debye temperatures reported for InP vary between 220 and 440 K depending on the temperature and method of determination.
dc.publisherAmerican Institute of Physics (AIP)
dc.relation.ispartofseries6th International Conference on Synchrotron Radiation in Materials Science
dc.sourceSYNCHROTRON RADIATION IN MATERIALS SCIENCE: Proceedings of the 6th International Conference on Synchrotron Radiation in Materials Science
dc.source.urihttp://scitation.aip.org/content/aip/proceeding/aipcp/1092
dc.titleTemperature-dependent EXAFS measurements of InP
dc.typeConference paper
local.description.notesImported from ARIES
local.description.refereedYes
dc.date.issued2009
local.identifier.absfor100700 - NANOTECHNOLOGY
local.identifier.absfor100799 - Nanotechnology not elsewhere classified
local.identifier.absfor020405 - Soft Condensed Matter
local.identifier.ariespublicationf5625xPUB13061
local.type.statusPublished Version
local.contributor.affiliationSchnohr, Claudia, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationKluth, Patrick, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationAraujo, Leandro, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationSprouster, David, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationForan, Garry J, Australian Nuclear Science and Technology Organisation
local.contributor.affiliationRidgway, Mark C, College of Physical and Mathematical Sciences, ANU
local.bibliographicCitation.startpage132
local.bibliographicCitation.lastpage134
local.identifier.doi10.1063/1.3086208
dc.date.updated2015-12-12T07:46:06Z
local.identifier.scopusID2-s2.0-64849097992
CollectionsANU Research Publications

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