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Temperature-dependent EXAFS measurements of InP

Schnohr, Claudia; Kluth, Patrick; Araujo, Leandro; Sprouster, David; Foran, Garry J; Ridgway, Mark C


The extended X-ray absorption fine structure (EXAFS) of crystalline InP was measured in the temperature range of 20-295 K. Structural parameters were determined for the first, second and third nearest neighbor (NN) shells. The Debye-Waller factors increase as functions of both radial distance and temperature. The first NN Debye-Waller factor increases slowly with temperature whereas those for the second and third NN shell increase significantly. The influence of correlated motion on the...[Show more]

CollectionsANU Research Publications
Date published: 2009
Type: Conference paper
Source: SYNCHROTRON RADIATION IN MATERIALS SCIENCE: Proceedings of the 6th International Conference on Synchrotron Radiation in Materials Science
DOI: 10.1063/1.3086208


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