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Photo-ionisation spectra of single erbium centres by charge sensing with a nano transistor

Yin, Chunming; Rancic, Milos; Stavrias, Nikolas; de Boo, Gabriele G.; McCallum, Jeffrey C; Sellars, Matthew; Rogge, Sven


We show the photo-ionisation of an individual erbium centre in silicon. A single-electron transistor is used as a charge detector to observe the resonant ionization as a function of photon energy. This allows for optical addressing and electrical detection of individual erbium centres with exceptionally narrow line width.

CollectionsANU Research Publications
Date published: 2012
Type: Conference paper
Source: Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD
DOI: 10.1109/COMMAD.2012.6472428


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