Core-level photoemission and near-edge x-ray absorption fine-structure studies of GaN surface under low-energy ion bombardment
-
Altmetric Citations
Petravic, Mladen; Deenapanray, Prakash; Coleman, Victoria A; Kim, K J; Kim, Bongsoo; Li, Gang
Description
The compositional changes on GaN surfaces under the low energy Ar ion bombardment were analyzed. The bombarded surfaces were characterized using synchrotron-based high-resolution core-level photoemission measurements and near-edge x-ray absorption fine-structure (NEXAFS) spectroscopy. The uncoordinated Ga nad N atoms at the surface were formed due to the impact of energetic Ar ions which break the Ga-N bond on the GaN surface. It was observed that the low-energy ion bombardment of GaN had...[Show more]
Collections | ANU Research Publications |
---|---|
Date published: | 2004 |
Type: | Journal article |
URI: | http://hdl.handle.net/1885/82530 |
Source: | Journal of Applied Physics |
DOI: | 10.1063/1.1707232 |
Download
Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.
Updated: 17 November 2022/ Responsible Officer: University Librarian/ Page Contact: Library Systems & Web Coordinator