Ion-Irradiation-Induced Preferential Amorphization of Ge Nanocrystals in Silica
Extended x-ray absorption fine structure (EXAFS) measurements have been used to characterize the ion-irradiation-induced crystalline-to-amorphous phase transformation in Ge nanocrystals. The atomic-scale structure of Ge nanocrystals in a silica matrix is
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|Source:||Physical Review B: Condensed Matter and Materials|
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