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Ion-Irradiation-Induced Preferential Amorphization of Ge Nanocrystals in Silica

Ridgway, Mark C; Azevedo, G de M; Elliman, Robert; Glover, Christopher; Llewellyn, David; Miller, R; Wesch, W; Foran, Garry J; Hansen, Jeffrey; Nylandsted-Larsen, A


Extended x-ray absorption fine structure (EXAFS) measurements have been used to characterize the ion-irradiation-induced crystalline-to-amorphous phase transformation in Ge nanocrystals. The atomic-scale structure of Ge nanocrystals in a silica matrix is

CollectionsANU Research Publications
Date published: 2005
Type: Journal article
Source: Physical Review B: Condensed Matter and Materials
DOI: 10.1103/PhysRevB.71.094107


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