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Track Formation and Surface Evolution in Indium Phosphide Irradiated by Swift Heavy Ions

Khalil, Ali S; Chadderton, Lewis; Stewart, Andrew; Ridgway, Mark C; Llewellyn, David; Byrne, Aidan

Description

Transmission electron microscopy (TEM) and atomic force microscopy (AFM) have been used to study radiation effects in 200 MeV Au ion-irradiated InP single crystals. The observations reveal the presence of individual tracks of intermittent nature about 10

CollectionsANU Research Publications
Date published: 2005
Type: Journal article
URI: http://hdl.handle.net/1885/81241
Source: Radiation Measurements
DOI: 10.1016/j.radmeas.2005.05.018

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