Characterisation of molecular nitrogen in ion-bombarded compound semiconductors by synchrotron-based absorption and emission spectroscopies
-
Altmetric Citations
Bozanic, A; Majlinger, Z; Petravic, Mladen; Gao, Qiang; Llewellyn, David; Crotti, C.; Yang, Y W; Kim, K J; Kim, Bongsoo
Description
We have studied formation of molecular nitrogen under low-energy nitrogen bombardment in a range of compound semiconductors by synchrotron-based X-ray photoelectron spectroscopy (XPS) around N 1s core-level and near-edge X-ray absorption fine structure (NEXAFS) around N K-edge. We have found interstitial molecular nitrogen, N2, in all samples under consideration. The presence of N2 produces a sharp resonance in low-resolution NEXAFS spectra at around 400.8 eV, showing the characteristic...[Show more]
Collections | ANU Research Publications |
---|---|
Date published: | 2009 |
Type: | Journal article |
URI: | http://hdl.handle.net/1885/80109 |
Source: | Vacuum |
DOI: | 10.1016/j.vacuum.2009.04.020 |
Download
File | Description | Size | Format | Image |
---|---|---|---|---|
01_Bozanic_Characterisation_of_molecular_2009.pdf | 356.94 kB | Adobe PDF | Request a copy |
Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.
Updated: 17 November 2022/ Responsible Officer: University Librarian/ Page Contact: Library Systems & Web Coordinator