High-resolution refractive index and micro-raman spectroscopy of planar waveguides in KGd(WO4)2 formed by swift heavy ion irradiation
We report on the characterization of planar waveguides formed in the Raman-active crystal KGd(WO4)2 using swift carbon, fluorine, and oxygen ion irradiation. The characterization of the waveguiding regions was performed using high-resolution microreflectivity and micro-Raman spectroscopy. The high-resolution microreflectivity measurement fully characterizes the refractive index profile of the barrier formed by amorphization of the crystal and detects other index variations not detected by the...[Show more]
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|Source:||IEEE Journal of Quantum Electronics|
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