Dolde, F.; Fedder, H.; Doherty, Marcus; Nobauer, T.; Rempp, F.; Balasubramanian, G; Wolf, T.; Reinhart, F; Hollenberg, Lloyd; Jelezko, F; Wrachtrup, J
The ability to sensitively detect individual charges under ambient conditions would benefit a wide range of applications across disciplines. However, most current techniques are limited to low-temperature methods such as single-electron transistors1,2, single-electron electrostatic force microscopy and scanning tunnelling microscopy4. Here we introduce a quantum-metrology technique demonstrating precision three-dimensional electric-field measurement using a single nitrogen-vacancy defect centre...[Show more]
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