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EMS Measurements of the Valence Spectral Function of Silicon - A Test of Many-Body Theory

Bowles, Cameron A; Kheifets, Anatoli; Sashin, Vladimir; Vos, Maarten; Weigold, Erich; Aryasetiawan, Ferdi

dc.contributor.authorBowles, Cameron A
dc.contributor.authorKheifets, Anatoli
dc.contributor.authorSashin, Vladimir
dc.contributor.authorVos, Maarten
dc.contributor.authorWeigold, Erich
dc.contributor.authorAryasetiawan, Ferdi
dc.date.accessioned2015-12-13T22:38:20Z
dc.date.available2015-12-13T22:38:20Z
dc.identifier.isbn3527404775
dc.identifier.urihttp://hdl.handle.net/1885/77511
dc.publisherWiley-VCH Verlag GMBH
dc.relation.ispartofCorrelation Spectroscopy of Surfaces, Thin Films, and Nanostructures
dc.relation.isversionof1 Edition
dc.titleEMS Measurements of the Valence Spectral Function of Silicon - A Test of Many-Body Theory
dc.typeBook chapter
local.description.notesImported from ARIES
local.description.refereedYes
dc.date.issued2004
local.identifier.absfor020201 - Atomic and Molecular Physics
local.identifier.ariespublicationMigratedxPub6360
local.type.statusPublished Version
local.contributor.affiliationBowles, Cameron A, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationKheifets, Anatoli, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationSashin, Vladimir, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationVos, Maarten, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationWeigold, Erich, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationAryasetiawan, Ferdi, National Institute of Advanced Industrial Science and Technology
local.bibliographicCitation.startpage83
local.bibliographicCitation.lastpage104
dc.date.updated2015-12-11T09:43:16Z
local.bibliographicCitation.placeofpublicationWeinheim
CollectionsANU Research Publications

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