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The Direct Measurement of Spectral Momentum Densities of Silicon with High Energy (e,2e) Spectroscopy

Bowles, Cameron A; Kheifets, Anatoli; Sashin, Vladimir; Vos, Maarten; Weigold, Erich

Description

Electron momentum spectroscopy is a coincidence technique that measures the spectral momentum density of matter. In this paper we outline the theoretical framework underlying these measurements, give a description of the spectrometer, and show in detail the information this technique can provide for the prototypical material silicon. We present results for single crystals as well as amorphous samples, describe the influence that diffraction and inelastic multiple scattering have on these...[Show more]

dc.contributor.authorBowles, Cameron A
dc.contributor.authorKheifets, Anatoli
dc.contributor.authorSashin, Vladimir
dc.contributor.authorVos, Maarten
dc.contributor.authorWeigold, Erich
dc.date.accessioned2015-12-13T22:38:16Z
dc.date.available2015-12-13T22:38:16Z
dc.identifier.issn0368-2048
dc.identifier.urihttp://hdl.handle.net/1885/77475
dc.description.abstractElectron momentum spectroscopy is a coincidence technique that measures the spectral momentum density of matter. In this paper we outline the theoretical framework underlying these measurements, give a description of the spectrometer, and show in detail the information this technique can provide for the prototypical material silicon. We present results for single crystals as well as amorphous samples, describe the influence that diffraction and inelastic multiple scattering have on these measurements. The results are compared with full-potential linear-muffin-tin-orbital (FP-LMTO) calculations (for dispersion), and many-body calculations (for line shapes).
dc.publisherElsevier
dc.sourceJournal of Electron Spectroscopy and Related Phenomena
dc.subjectKeywords: Band structure; Diffraction; Electrons; Functions; Sampling; Single crystals; Spectroscopic analysis; Electron momentum spectroscopy; Multiple scattering; Spectral function; Spectral momentum; Silicon Band structure; Electron momentum spectroscopy; Silicon; Spectral function
dc.titleThe Direct Measurement of Spectral Momentum Densities of Silicon with High Energy (e,2e) Spectroscopy
dc.typeJournal article
local.description.notesImported from ARIES
local.description.refereedYes
local.identifier.citationvolume141
dc.date.issued2004
local.identifier.absfor020201 - Atomic and Molecular Physics
local.identifier.ariespublicationMigratedxPub6332
local.type.statusPublished Version
local.contributor.affiliationBowles, Cameron A, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationKheifets, Anatoli, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationSashin, Vladimir, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationVos, Maarten, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationWeigold, Erich, College of Physical and Mathematical Sciences, ANU
local.bibliographicCitation.startpage95
local.bibliographicCitation.lastpage104
local.identifier.doi10.1016/j.elspec.2004.05.006
dc.date.updated2016-02-24T09:48:50Z
local.identifier.scopusID2-s2.0-8344241860
CollectionsANU Research Publications

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