Measurement of the Electronic Structure of Crystalline Silicon by Electron Momentum Spectroscopy

Abstract

Electron momentum spectroscopy (EMS) is a scattering experiment that determines the spectral function of a sample, i.e. the density of electrons as a function of binding energy and momentum. Here, it is used to study the spectral function of silicon single crystals in the extended zone scheme. Two symmetry directions and four intermediate directions are measured. The relation between the band index and the main observed momentum component is discussed. The observed peak shapes are compared with many-body calculations based on the cumulant expansion scheme. The dispersion is described well, but peak shapes agree with many-body theory only on a semi-quantitative level.